Facilities and Capabilities of the SST Partnership
Perkin-Elmer
550 Multitechnique Surface Analyzer (Kirk 211)
Auger Spectroscopy
Secondary Ion Mass Spectrometry (SIMS)
X-ray Photoelectron Spectroscopy (XPS, ESCA)
Microscopy Laboratory (Kirk 210 & Kirk 211)
Atomic Force Microscopy (AFM)
Scanning Tunneling Microscopy (STM)
Scanning Electron Microscopy (SEM)
Energy Dispersive X-ray Analysis (EDX)
Low Vacuum Environment
Gun Shot Residue Analysis
Optical Microscope
Sun Workstation for Image Analysis
Thin Film Glancing Angle X-ray Diffractometer (Bay Campus)
Spectroscopy
Near Infrared/Visible/Ultraviolet Spectroscopy (NIR/Vis/UV)
Total Diffuse Reflectance Spectroscopy
Raman Spectroscopy
Infrared Spectroscopy (transmission and specular reflectance)
Thermal Analysis
Modulated Differential Scanning Calorimeter
Simultaneous Thermal Gravimetric Analysis/Differential Scanning Calorimeter
Thin Film Fabrication
Sputtering Machines
Evaporation Facilities
Ion Beam Milling
Plasma Oxidation/Nitridation
Ozone Cleaner
Lithography (Spin-coater, Aligner, Bake Tool)
Dektak II Surface profilometer
Potentiostats/Galvanostats
Ellipsometry
CAD Facilities
|